BS EN 60749:1999被替代
Semiconductor devices. Mechanical and climatic test methods
出版：British Standards Institution
专家解读视频
Uniform preferred test methods and values for stress levels for judging the environmental properties of semiconductor devices (discrete and integrated circuits) from which a selection may be made.
© British Standards Institution 2013
General notes:
This standard has been withdrawn as it has been replaced by various parts of the new series of BS EN 60749 standards.
Amendment notes:
AMD 13129 published 13 September 2001
AMD 13694, September 2002 (not available separately)
SN EN 60749:1999 - Identical
SS EN 60749:1999 - Identical
EN 60749:1999 - Identical
DIN EN 60749 : 2002 - Identical
I.S. EN 60749:1944 - Identical
NF EN 60749 : 99 AMD 2 2002 - Identical
EN 60749 : 99 AMD 2 2001 - Identical
UNE EN 60749 : 2000 A2 2002 - Identical
DIN EN 60749 : 2002 - Identical
SN EN 60749 : 1999 AMD 1 2000 - Identical
NBN EN 60749 : 99 AMD 2 2002 - Identical
NBN EN 60749:1999 - Identical
IEC 60749 Ed. 2.2 - Equivalent
IEC 60749 Ed. 2.0 - Identical
I.S. EN 60749:1999 - Identical
DIN EN 60749 (2002-09) - Identical
NF EN 60749:1999 - Identical
UNE EN 60749:2000 - Identical
I.S. EN 60749:1944 - Identical
