IEC 60749 Ed. 2.2被替代
Semiconductor devices - Mechanical and climatic test methods
出版：International Electrotechnical Committee
专家解读视频
Lists test methods applicable to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made. Establishes uniform preferred test methods with preferred values for stress levels for judging the environmental properties of semiconductor devices.
BIS IS 12641:2004 - Identical
NEN EN IEC 60749:1999 - Identical
UNE 20699:1992 - Identical
SS IEC 749:1993 - Identical
SS EN 60749:1999 - Identical
EN 60749:1999 - Identical
PN EN 60749:2003 - Identical
NF EN 60749:1999 - Identical
OVE/ONORM EN 60749:2000 - Identical
DIN EN 60749 (2002-09) - Identical
DIN IEC 60749 (1987-09) - Identical
BS EN 60749:1999 - Equivalent
SN EN 60749:1999 - Identical
CEI EN 60749:2000 - Identical
I.S. EN 60749:1999 - Identical
UNE EN 60749:2000 - Identical
