BS EN 60749-27 : 2006现行
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 27: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING - MACHINE MODEL (MM)
出版：British Standards Institution
专家解读视频
Describes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model (MM) electrostatic discharge (ESD).
DIN EN 60749-27 : 2013 - Identical
I.S. EN 60749-27:2006 - Identical
IEC 60749-27 : 2.1 - Identical
DIN EN 60749-27 : 2013 - Identical
IEC 60749-27 : 2.1 - Identical
NBN EN 60749-27 : 2007 AMD 1 2012 - Identical
EN 60749-27 : 2006 AMD 1 2012 - Identical
NF EN 60749-27 : 2006 AMD 1 2013 - Identical
I.S. EN 60749-27:2006 - Identical
