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BS EN 60749-10:2002现行

Semiconductor devices. Mechanical and climatic test methods. Mechanical shock

出版：British Standards Institution

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基本信息

标准编号： BS EN 60749-10:2002

发布时间：2002/8/28 0:00:00

标准类别：Standard

出版单位：British Standards Institution

标准页数：8

标准简介

Specifies a shock test intended to determine the suitability of component parts for use in electronic equipment which may be subjected to moderately severe shocks as a result of suddenly applied forces or abrupt changes in motion produced by rough handling, transportation, or field operation.

标准备注

© British Standards Institution 2013

Replaces notes:
Partially replaces BS EN 60749:1999.

Amendment notes:
AMD 14112 published 17 September 2002
AMD 14112 is a Corrigendum

本标准替代的旧标准

BS EN 60749:1999

BS EN 60749 : 1999

00/203568 DC : DRAFT SEP 2000

等同采用的国际标准

EN 60749-10:2002 - Identical

UNE EN 60749-10:2003 - Identical

SS EN 60749-10 Ed. 1 (2003) - Identical

IEC 60749-10 Ed. 1.0 - Identical

I.S. EN 60749-10:2002 - Identical

NF EN 60749-10:2002 - Identical

NBN EN 60749-10:2003 - Identical