BS EN 60749-20:2003被替代
Semiconductor devices. Mechanical and climatic test methods. Resistance of plastic-encapsulated SMDs to the combined effect of moisture and soldering heat
出版：British Standards Institution
专家解读视频
© British Standards Institution 2013
IEC 60749-20 Ed. 1.0 - Identical
SS EN 60749-20 Ed. 1 (2003) - Identical
UNE EN 60749-20:2004 - Identical
I.S. EN 60749-20:2003 - Identical
NF EN 60749-20:2003 - Identical
NBN EN 60749-20:2004 - Identical
DIN EN 60749-20 (2003-12) - Identical
