BS EN 60749-27:2006+A1:2012现行
Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Machine model (MM)
出版：British Standards Institution
专家解读视频
© British Standards Institution 2013
Replaces notes:
Partially replaces BS EN 60749:1999.
Amendment notes:
Amendment, January 2013. Amends and replaces BS EN 60749-27:2006
IEC 60749-27 Ed. 2.0 - Identical
I.S. EN 60749-27:2006 - Identical
NF EN 60749-27:2006 - Identical
NBN EN 60749-27:2007 - Identical
EN 60749-27:2006 - Identical
SS EN 60749-27 Ed. 1 (2006) - Identical
DIN EN 60749-27 (2007-01) - Identical
DIN EN 60749-27 (2013-04) - Identical
SS EN 60749-27:2006 - Identical
