NBN EN 60749 : 99 AMD 2 2002被替代
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS
出版：Belgian Standards
专家解读视频
基本信息
标准编号： NBN EN 60749 : 99 AMD 2 2002
标准类别：Standard
出版单位：Belgian Standards
标准页数：0
标准简介
Defines test methods to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made. Additional test methods may be required for non-cavity devices.
等同采用的国际标准
DIN EN 60749 : 2002 - Identical
BS EN 60749 : 1999 - Identical
I.S. EN 60749:1944 - Identical
DIN EN 60749 : 2002 - Identical
