BS 6493-3(1985) : 1985已作废
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS
出版：British Standards Institution
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基本信息
标准编号： BS 6493-3(1985) : 1985
发布时间：1985/1/1 0:00:00
标准类别：Standard
出版单位：British Standards Institution
标准页数：42
标准简介
Gives selection test methods applicable to semiconductor devices (discrete devices and integrated circuits). Additional test methods may be required for non-cavity devices. Provides uniform preferred test methods with preferred values for stress levels for judging the environmental properties of semiconductor devices. Includes mechanical, climatic and miscellaneous test methods.
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