BS EN 60749-36:2003现行
Semiconductor devices. Mechanical and climatic test methods. Acceleration, steady state
出版：British Standards Institution
专家解读视频
Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices.
© British Standards Institution 2013
Replaces notes:
Partially replaces BS EN 60749:1999.
EN 60749-36:2003 - Identical
UNE EN 60749-36:2004 - Identical
SS EN 60749-36 Ed. 1 (2003) - Identical
IEC 60749-36 Ed. 1.0 - Identical
NF EN 60749-36:2003 - Identical
NBN EN 60749-36:2004 - Identical
DIN EN 60749-36 (2003-12) - Identical
SN EN 60749-36:2003 - Identical
I.S. EN 60749-36:2003 - Identical
NBN EN 60749-36 : 2004 - Identical
EN 60749-36 : 2003 - Identical
UNE EN 60749-36 : 2004 - Identical
SN EN 60749-36 : 2003 - Identical
I.S. EN 60749-36:2003 - Identical
NF EN 60749-36 : 2003 - Identical
IEC 60749-36 : 1.0 - Identical
DIN EN 60749-36 : 2003 - Identical
I.S. EN 60749-36:2003 - Identical
DIN EN 60749-36 : 2003 - Identical
