UNE EN 60749:2000被替代
Semiconductor Devices - Mechanical And Climatic Test Methods
出版：Asociacion Espanola de Normalizacion
专家解读视频
Defines test methods to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made. Additional test methods may be required for non-cavity devices.
Supersedes UNE 20699. (09/2003)
SS EN 60749:1999 - Identical
I.S. EN 60749:1999 - Identical
IEC 60749 Ed. 2.2 - Identical
NBN EN 60749:1999 - Identical
NF EN 60749:1999 - Identical
DIN EN 60749 (2002-09) - Identical
BS EN 60749:1999 - Identical
SN EN 60749:1999 - Identical
EN 60749:1999 - Identical
