
Semiconductor devices. Mechanical and climatic test methods
出版:British Standards Institution

专家解读视频
基本信息
标准编号: BS 6493-3:1985
发布时间:1986/1/31 0:00:00
标准类别:Standard
出版单位:British Standards Institution
标准页数:94
标准简介
Special requirements for test methods additional to IEC 60068, and certain specific and complete test methods.
标准备注
© British Standards Institution 2013
Amendment notes:
AMD 7121 published 15 August 1992
AMD 8089 published 15 February 1994
替代本标准的新标准