I.S. EN 60749:1999被替代

Defines test methods to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made. Additional test methods may be required for non-cavity devices.

I.S. EN 60749-1:2003

I.S. EN 60749-13:2002

I.S. EN 60749-12:2002

I.S. EN 60749-11:2002

I.S. EN 60749-10:2002

I.S. EN 60749-9:2002

BS EN 60749:1999 - Identical

SN EN 60749:1999 - Identical

IEC 60749 Ed. 2.2 - Identical

NBN EN 60749:1999 - Identical

NF EN 60749:1999 - Identical

DIN EN 60749 (2002-09) - Identical

SS EN 60749:1999 - Identical

EN 60749:1999 - Identical

UNE EN 60749:2000 - Identical