BS EN 60749-11:2002现行
Semiconductor devices. Mechanical and climatic test methods. Rapid change of temperature. Two-fluid-bath method
出版：British Standards Institution
专家解读视频
Describes the rapid change of temperature test method and the two-fluid-bath method. It is applicable to all semiconductor devices.
© British Standards Institution 2013
Replaces notes:
Partially replaces BS EN 60749:1999.
Amendment notes:
AMD 14681 published 24 October 2003
AMD 14681 is a Corrigendum
EN 60749-11:2002 - Identical
IEC 60749-11 : 1.0 - Identical
UNE EN 60749-11 : 2003 - Identical
DIN EN 60749-11 : 2003 - Identical
I.S. EN 60749-11:2002 - Identical
NF EN 60749-11 : 2002 - Identical
NBN EN 60749-11 : 2003 - Identical
EN 60749-11 : 2002 - Identical
DIN EN 60749-11 : 2003 - Identical
I.S. EN 60749-11:2002 - Identical
DIN EN 60749-11 (2003-04) - Identical
NBN EN 60749-11:2003 - Identical
NF EN 60749-11:2002 - Identical
I.S. EN 60749-11:2002 - Identical
IEC 60749-11 Ed. 1.0 - Identical
SS EN 60749-11 Ed. 1 (2003) - Identical
UNE EN 60749-11:2003 - Identical
