BS EN 60749-5:2003被替代
Semiconductor devices. Mechanical and climatic test methods. Steady-state temperature humidity bias life test
出版：British Standards Institution
专家解读视频
© British Standards Institution 2013
Replaces notes:
Partially replaces BS EN 60749:1999.
UNE EN 60749-5:2003 - Identical
SS EN 60749-5 Ed. 1 (2003) - Identical
IEC 60749-5 Ed. 1.0 - Identical
SN EN 60749-5:2003 - Identical
I.S. EN 60749-5:2003 - Identical
NF EN 60749-5:2003 - Identical
NBN EN 60749-5:2004 - Identical
DIN EN 60749-5 (2003-09) - Identical
EN 60749-5:2017 - Identical
