BS EN 60749-7:2002被替代
Semiconductor devices. Mechanical and climatic test methods. Internal moisture content measurement and the analysis of other residual gases
出版：British Standards Institution
专家解读视频
© British Standards Institution 2013
Replaces notes:
Partially replaces BS EN 60749:1999.
Amendment notes:
AMD 14111 published 17 September 2002
AMD 14111 is a Corrigendum
UNE EN 60749-7:2003 - Identical
IEC 60749-7 Ed. 1.0 - Identical
I.S. EN 60749-7:2002 - Identical
NF EN 60749-7:2002 - Identical
NBN EN 60749-7:2003 - Identical
DIN EN 60749-7 (2003-04) - Identical
