IEC 60749 Ed. 2.0被替代
Semiconductor devices - Mechanical and climatic test methods
出版：International Electrotechnical Committee
专家解读视频
基本信息
标准编号： IEC 60749 Ed. 2.0
发布时间：1996/10/28 0:00:00
标准类别：Standard
出版单位：International Electrotechnical Committee
标准页数：95
标准简介
Lists test methods applicable to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made. Establishes uniform preferred test methods with preferred values for stress levels for judging the environmental properties of semiconductor devices.
等同采用的国际标准
BS EN 60749:1999 - Identical
