BS EN 60749-1:2003现行
Semiconductor devices. Mechanical and climatic test methods. General
出版：British Standards Institution
专家解读视频
Applies to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series.
© British Standards Institution 2013
IEC 60749-1 : 1.0 - Identical
UNE EN 60749-1 : 2004 - Identical
SN EN 60749-1 : 2003 - Identical
NBN EN 60749-1 : 2004 - Identical
NF EN 60749-1 : 2003 - Identical
I.S. EN 60749-1:2003 - Identical
EN 60749-1 : 2003 - Identical
DIN EN 60749-1 : 2003 - Identical
DIN EN 60749-1 : 2003 - Identical
I.S. EN 60749-1:2003 - Identical
NF EN 60749-1:2003 - Identical
NBN EN 60749-1:2004 - Identical
DIN EN 60749-1 (2003-12) - Identical
SN EN 60749-1:2003 - Identical
IEC 60749-1 Ed. 1.0 - Identical
UNE EN 60749-1:2004 - Identical
SS EN 60749-1 Ed. 1 (2003) - Identical
I.S. EN 60749-1:2003 - Identical
