IEC 60749-11 Ed. 1.0现行
Semiconductor devices - Mechanical and climatic test methods Part 11: Rapid change of temperature - Two-fluid-bath method
出版：International Electrotechnical Committee
专家解读视频
Defines the rapid change of temperature test method and the two-fluid-bath method. This test method may also be used, employing fewer cycles, to test the effect of immersion in heated liquids that are used for the purpose of cleaning devices. This test is applicable to all semiconductor devices. It is considered destructive unless otherwise detailed in the relevant specification. The contents of the corrigenda of January 2003 and August 2003 have been included in this copy.
OVE/ONORM EN 60749-11:2003 - Identical
NEN EN IEC 60749-11:2002 - Identical
EN 60749-11:2002 - Identical
SS EN 60749-11 Ed. 1 (2003) - Identical
PN EN 60749-11:2004 - Identical
I.S. EN 60749-11:2002 - Identical
NF EN 60749-11:2002 - Identical
BS EN 60749-11:2002 - Identical
UNE EN 60749-11:2003 - Identical
DIN EN 60749-11 (2003-04) - Identical
CEI EN 60749-11 Ed. 1 (2004) - Identical
