
Acoustic microscopy for nonhermetic encapsulated electronic components
出版:International Electrotechnical Committee

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基本信息
标准编号: IEC/PAS 62191 Ed. 1.0
发布时间:2000/11/1 0:00:00
标准类别:Standard
出版单位:International Electrotechnical Committee
标准页数:16
标准简介
This test method defines the procedures for performing acoustic microscopy on nonhermetic encapsulated electronic components. This method provides users with an acoustic microscopy process flow for detecting anomalies (delamination, cracks, mold compound voids, etc.) nondestructively in plastic packages while achieving reproducibility.