IEC 60749-5 Ed. 1.0被替代
Semiconductor devices - Mechanical and climatic test methods Part 5: Steady-state temperature humidity bias life test
出版：International Electrotechnical Committee
专家解读视频
Provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.
PN EN 60749-5:2005 - Identical
NF EN 60749-5:2003 - Identical
DIN EN 60749-5 (2003-09) - Identical
BS EN 60749-5:2003 - Identical
SN EN 60749-5:2003 - Identical
CEI EN 60749-5 Ed. 1 (2005) - Identical
I.S. EN 60749-5:2003 - Identical
SS EN 60749-5 Ed. 1 (2003) - Identical
UNE EN 60749-5:2003 - Identical
NEN EN IEC 60749-5:2003 - Identical
OVE/ONORM EN 60749-5:2003 - Identical
