IEC 60749-36 Ed. 1.0现行
Semiconductor devices - Mechanical and climatic test methods Part 36: Acceleration, steady state
出版：International Electrotechnical Committee
专家解读视频
Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.
NF EN 60749-36:2003 - Identical
I.S. EN 60749-36:2003 - Identical
PN EN 60749-36:2005 - Identical
SS EN 60749-36 Ed. 1 (2003) - Identical
UNE EN 60749-36:2004 - Identical
EN 60749-36:2003 - Identical
BS EN 60749-36:2003 - Identical
DIN EN 60749-36 (2003-12) - Identical
NEN EN IEC 60749-36:2003 - Identical
OVE/ONORM EN 60749-36:2004 - Identical
CEI EN 60749-36 Ed. 1 (2004) - Identical
SN EN 60749-36:2003 - Identical
