IEC 60749-10 Ed. 1.0现行
Semiconductor devices - Mechanical and climatic test methods Part 10: Mechanical shock
出版：International Electrotechnical Committee
专家解读视频
Describes a shock test intended to determine the suitability of component parts for use in electronic equipment which may be subjected to moderately severe shocks as a result of suddenly applied forces or abrupt changes in motion produced by rough handling, transportation, or field operation. Shock of this type may disturb operating characteristics, particularly if the shock pulses are repetitive. This is a destructive test. It is normally applicable to cavity-type packages. The contents of the corrigendum of August 2003 have been included in this copy.
I.S. EN 60749-10:2002 - Identical
NF EN 60749-10:2002 - Identical
BS EN 60749-10:2002 - Identical
CEI EN 60749-10 Ed. 1 (2004) - Identical
Amd 14112 (Corr to BS EN 60749-10:2002) - Identical
DIN EN 60749-10 (2003-04) - Identical
UNE EN 60749-10:2003 - Identical
PN EN 60749-10:2004 - Identical
SS EN 60749-10 Ed. 1 (2003) - Identical
EN 60749-10:2002 - Identical
NEN EN IEC 60749-10:2002 - Identical
OVE/ONORM EN 60749-10:2003 - Identical
