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IEC 60749-32 Ed. 1.0现行

Semiconductor devices - Mechanical and climatic test methods Part 32: Flammability of plastic-encapsulated devices (externally induced)

出版：International Electrotechnical Committee

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基本信息

标准编号： IEC 60749-32 Ed. 1.0

发布时间：2002/8/30 0:00:00

标准类别：Standard

出版单位：International Electrotechnical Committee

标准页数：9

标准简介

Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to external heating. The test uses a needle flame, simulating the effect of small flames which may result from fault conditions within equipment containing the device. The contents of the corrigendum of August 2003 have been included in this copy.

本标准替代的旧标准

IEC 60749 Ed. 2.2

替代本标准的新标准

IEC 60749-32 Ed. 1.1

等同采用的国际标准

BS EN 60749-32:2003+A1:2010 - Identical

CEI EN 60749-32 Ed. 1 (2004) - Identical

SN EN 60749-32:2003 - Identical

BS EN 60749-32:2003 - Identical

DIN EN 60749-32 (2003-12) - Identical

NF EN 60749-32:2003 - Identical

I.S. EN 60749-32:2003 - Identical