IEC 60749-4 Ed. 1.0被替代
Semiconductor devices - Mechanical and climatic test methods Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
出版：International Electrotechnical Committee
专家解读视频
Provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments. The contents of the corrigendum of August 2003 have been included in this copy.
OVE/ONORM EN 60749-4:2003 - Identical
SS EN 60749-4 Ed. 1 (2003) - Identical
PN EN 60749-4:2004 - Identical
BS EN 60749-4:2002 - Identical
CEI EN 60749-4 Ed. 1 (2004) - Identical
NEN EN IEC 60749-4:2002 - Identical
NF EN 60749-4:2002 - Identical
UNE EN 60749-4:2003 - Identical
I.S. EN 60749-4:2002 - Identical
DIN EN 60749-4 (2003-04) - Identical
