IEC 60749-6 Ed. 1.0被替代
Semiconductor devices - Mechanical and climatic test methods Part 6: Storage at high temperature
出版：International Electrotechnical Committee
专家解读视频
Aims at testing and determining the effect on all semiconductor electronic devices of storage at elevated temperature without electrical stress applied. This test is considered non-destructive. The contents of the corrigendum of August 2003 have been included in this copy.
OVE/ONORM EN 60749-6:2003 - Identical
NEN EN IEC 60749-6:2002 - Identical
SS EN 60749-6 Ed. 1 (2003) - Identical
PN EN 60749-6:2004 - Identical
I.S. EN 60749-6:2002 - Identical
NF EN 60749-6:2002 - Identical
BS EN 60749-6:2002 - Identical
CEI EN 60749-6 Ed. 1 (2004) - Identical
DIN EN 60749-6 (2003-04) - Identical
UNE EN 60749-6:2003 - Identical
