SS EN 60749-6 Ed. 1 (2003)现行
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 6: Storage At High Temperature
出版：Standardiserings-Kommissionen I Sverige
专家解读视频
Determines and test the effect on all semiconductor electronic devices of storage at elevated temperature without electrical stress applied.
UNE EN 60749-6:2003 - Identical
IEC 60749-6 Ed. 1.0 - Identical
BS EN 60749-6:2017 - Identical
EN 60749-6:2017 - Identical
BS EN 60749-6:2002 - Identical
DIN EN 60749-6 (2003-04) - Identical
NBN EN 60749-6:2003 - Identical
NF EN 60749-6:2002 - Identical
I.S. EN 60749-6:2002 - Identical
