DIN EN 60749-6 (2003-04)现行
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 6: Storage At High Temperature
出版：German Institute for Standardisation (Deutsches Institut für Normung)
专家解读视频
Determines and test the effect on all semiconductor electronic devices of storage at elevated temperature without electrical stress applied.
Supersedes DIN EN 60749 (06/2005)
UNE EN 60749-6:2003 - Identical
SS EN 60749-6 Ed. 1 (2003) - Identical
IEC 60749-6 Ed. 1.0 - Identical
I.S. EN 60749-6:2002 - Identical
NF EN 60749-6:2002 - Identical
NBN EN 60749-6:2003 - Identical
BS EN 60749-6:2002 - Identical
EN 60749-6:2017 - Identical
