NF EN 60749-6:2002现行
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 6: Storage At High Temperature
出版：Association Francaise de Normalisation
专家解读视频
Determines and test the effect on all semiconductor electronic devices of storage at elevated temperature without electrical stress applied.
Indice de classement: C96-022-6. (03/2003) Supersedes NF EN 60749. (06/2007)
BS EN 60749-6:2017 - Identical
DIN EN 60749-6 : 2016 - Identical
I.S. EN 60749-6:2017 - Identical
BS EN 60749-6 : 2017 - Identical
DIN EN 60749-6 : 2016 - Identical
EN 60749-6:2017 - Identical
BS EN 60749-6:2002 - Identical
DIN EN 60749-6 (2003-04) - Identical
NBN EN 60749-6:2003 - Identical
I.S. EN 60749-6:2002 - Identical
IEC 60749-6 Ed. 1.0 - Identical
SS EN 60749-6 Ed. 1 (2003) - Identical
UNE EN 60749-6:2003 - Identical
