IEC/PAS 62205 Ed. 1.0被替代
High temperature storage life
出版：International Electrotechnical Committee
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基本信息
标准编号： IEC/PAS 62205 Ed. 1.0
发布时间：2000/11/1 0:00:00
标准类别：Standard
出版单位：International Electrotechnical Committee
标准页数：3
标准简介
Aims to determine the effect on solid state electronic devices of storage at elevated temperature without electrical stress applied. This test is considered destructive and therefore, is applicable for device qualification.
替代本标准的新标准
等同采用的国际标准
NEN NPR IEC/PAS 62205:2001 - Identical
