I.S. EN 60749-6:2002被替代
Semiconductor Devices - Mechanical And Climatic Test Methods Part 6: Storage At High Temperature
出版：National Standards Authority of Ireland
专家解读视频
Determines and test the effect on all semiconductor electronic devices of storage at elevated temperature without electrical stress applied.
EN 60749-6:2017 - Identical
BS EN 60749-6:2002 - Identical
DIN EN 60749-6 (2003-04) - Identical
NBN EN 60749-6:2003 - Identical
NF EN 60749-6:2002 - Identical
IEC 60749-6 Ed. 1.0 - Identical
SS EN 60749-6 Ed. 1 (2003) - Identical
UNE EN 60749-6:2003 - Identical
