IEC 60749-27 Ed. 2.0现行
Semiconductor devices - Mechanical and climatic test methods Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
出版：International Electrotechnical Committee
专家解读视频
Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model (MM) electrostatic discharge (ESD). It may be used as an alternative test method to the human body model ESD test method. The objective is to provide reliable, repeatable ESD test results so that accurate classifications can be performed. This test method is applicable to all semiconductor devices and is classified as destructive
PN EN 60749-27:2008 - Identical
NEN EN IEC 60749-27:2007 - Identical
CEI EN 60749-27 Ed. 1 (2007) - Identical
BS EN 60749-27:2006+A1:2012 - Identical
DIN EN 60749-27 (2007-01) - Identical
NF EN 60749-27:2006 - Identical
I.S. EN 60749-27:2006 - Identical
PN EN 60749-27:2006 - Identical
SS EN 60749-27 Ed. 1 (2006) - Identical
EN 60749-27:2006 - Identical
OVE/ONORM EN 60749-27:2007 - Identical
