
BS EN 60749-27 AMD1. Semiconductor devices. Mechanical and climatic test methods. Part 27. Electrostatic discharge (ESD) sensitivity testing. Machine model (MM)
出版:British Standards Institution

专家解读视频
BS EN 60749-27 AMD1. Semiconductor devices. Mechanical and climatic test methods. Part 27. Electrostatic discharge (ESD) sensitivity testing. Machine model (MM)
出版:British Standards Institution
专家解读视频