I.S. EN 60749-27:2006现行
Semiconductor Devices - Mechanical and Climatic Test Methods Part 27: Electrostatic Discharge (esd) Sensitivity Testing - Machine Model (mm) (iec 60749-27:2006 (eqv))
出版：National Standards Authority of Ireland
专家解读视频
Describes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model (MM) electrostatic discharge (ESD).
SS EN 60749-27 Ed. 1 (2006) - Identical
IEC 60749-27 Ed. 2.0 - Identical
NF EN 60749-27:2006 - Identical
NBN EN 60749-27:2007 - Identical
DIN EN 60749-27 (2007-01) - Identical
BS EN 60749-27:2006+A1:2012 - Identical
EN 60749-27:2006 - Identical
SS EN 60749-27:2006 - Identical
BS EN 60749-27 : 2006 - Identical
EN 60749-27 : 2006 AMD 1 2012 - Identical
NBN EN 60749-27 : 2007 AMD 1 2012 - Identical
DIN EN 60749-27 : 2013 - Identical
NF EN 60749-27 : 2006 AMD 1 2013 - Identical
DIN EN 60749-27 : 2013 - Identical
BS EN 60749-27 : 2006 - Identical
