DIN EN 60749-27 (2013-04)现行
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 27: Electrostatic Discharge (esd) Sensitivity Testing - Machine Model (mm) (iec 60749-27:2006+a1:2012)
出版：German Institute for Standardisation (Deutsches Institut für Normung)
专家解读视频
2013 [01/04/2013]2007 [01/01/2007]DRAFT 2005 [01/05/2005]DRAFT 2002 [01/09/2002]
DIN EN 60749-27 issue 01-2007 remains valid alongside this standard until 30-10-2015. (04/2013)
SS EN 60749-27:2006 - Identical
BS EN 60749-27:2006+A1:2012 - Identical
NF EN 60749-27:2006 - Identical
EN 60749-27:2006 - Identical
NBN EN 60749-27:2007 - Identical
