DIN EN 60749-27 (2007-01)被替代
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 27: Electrostatic Discharge (esd) Sensitivity Testing - Machine Model (mm)
出版：German Institute for Standardisation (Deutsches Institut für Normung)
专家解读视频
Describes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model (MM) electrostatic discharge (ESD).
DRAFT AMD 1 issued in October 2011. (10/2011)
EN 60749-27:2006 - Identical
SS EN 60749-27 Ed. 1 (2006) - Identical
IEC 60749-27 Ed. 2.0 - Identical
I.S. EN 60749-27:2006 - Identical
NF EN 60749-27:2006 - Identical
NBN EN 60749-27:2007 - Identical
BS EN 60749-27:2006+A1:2012 - Identical
