NF EN 60749-27:2006现行
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 27: Electrostatic Discharge (esd) Sensivity Testing - Machine Model (mm)
出版：Association Francaise de Normalisation
专家解读视频
Describes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model (MM) electrostatic discharge (ESD).
Indice de classement: C96-022-27 PR NF EN 60749-27 April 2005 (04/2005)
EN 60749-27:2006 - Identical
NBN EN 60749-27:2007 - Identical
I.S. EN 60749-27:2006 - Identical
IEC 60749-27 Ed. 2.0 - Identical
SS EN 60749-27 Ed. 1 (2006) - Identical
SS EN 60749-27:2006 - Identical
DIN EN 60749-27 (2013-04) - Identical
BS EN 60749-27:2006+A1:2012 - Identical
DIN EN 60749-27 (2007-01) - Identical
