SS EN 60749-27:2006现行
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 27: Electrostatic Discharge (Esd) Sensitivity Testing - Machine Model (Mm)
出版：Standardiserings-Kommissionen I Sverige
专家解读视频
Describes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model (MM) electrostatic discharge (ESD).
I.S. EN 60749-27:2006 - Identical
EN 60749-27:2006 - Identical
BS EN 60749-27:2006+A1:2012 - Identical
NBN EN 60749-27:2007 - Identical
NF EN 60749-27:2006 - Identical
DIN EN 60749-27 (2013-04) - Identical
