半导体器件综合 -环标网

已选条件： 半导体器件综合

国家：

标准状态：

每页显示20 条，共找到 1734 条结果 <1/87>

标准编号	标准名称	发布部门	发布日期	状态
IEC 60747-1:2006+AMD1:2010 CSV	Semiconductor devices - Part 1: General	Internatio..	2020-03-08	现行
IEC 60747-1:2006/AMD1:2010	Amendment 1 - Semiconductor devices - Part 1: General	Internatio..	2020-03-08	现行
IEC 60747-1:2006/COR1:2008	Corrigendum 1 - Semiconductor devices - Part 1: General	Internatio..	2020-03-08	现行
IEC 60747-1:2006	Semiconductor devices - Part 1: General	Internatio..	2020-03-08	现行
I.S. EN IEC 60749-26:2018	Semiconductor Devices - Mechanical and Climatic Test Methods Part 26: Electrostatic Discharge (esd) Sensitivity Testing Human Body Model (hbm)	National S..	2018-04-10	现行
I.S. EN IEC 60749-12:2018	Semiconductor Devices - Mechanical and Climatic Test Methods Part 12: Vibration, Variable Frequency	National S..	2018-03-27	现行
IEC 60191-4 Ed. 3.1	Mechanical standardization of semiconductor devices Part 4: Coding system and classification into forms of package outlines for semiconductor device packages	Internatio..	2018-03-27	现行
IEC 60191-4 Amd.1 Ed. 3.0	Amendment 1 - Mechanical standardization of semiconductor devices Part 4: Coding system and classification into forms of package outlines for semiconductor device packages	Internatio..	2018-03-27	现行
ASTM F1190-18	Standard Guide for Neutron Irradiation of Unbiased Electronic Components	American S..	2018-03-01	现行
ASTM F1192-11(2018)	Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices	American S..	2018-03-01	现行
ASTM F1893-18	Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices	American S..	2018-03-01	现行
IEC 60749-13 Ed. 2.0	Semiconductor devices - Mechanical and climatic test methods Part 13: Salt atmosphere	Internatio..	2018-02-15	现行
IEC 60191-1 Ed. 3.0	Mechanical standardization of semiconductor devices Part 1: General rules for the preparation of outline drawings of discrete devices	Internatio..	2018-01-23	现行
IEC 60749-26 Ed. 4.0	Semiconductor devices - Mechanical and climatic test methods Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)	Internatio..	2018-01-15	现行
IEC 60749-12 Ed. 2.0	Semiconductor devices - Mechanical and climatic test methods Part 12: Vibration, variable frequency	Internatio..	2017-12-13	现行
IEC/TR 63133 Ed. 1.0	Semiconductor devices - Scan based ageing level estimation for semiconductor devices	Internatio..	2017-10-11	现行
I.S. EN 60749-43:2017	Semiconductor Devices - Mechanical and Climatic Test Methods Part 43: Guidelines for ic Reliability Qualification Plans	National S..	2017-09-19	现行
IEC 60050-521-Amd.1 Ed. 2.0	Amendment 1 - International Electrotechnical Vocabulary Part 521: Semiconductor devices and integrated circuits	Internatio..	2017-08-30	现行
IEC 62880-1 Ed. 1.0	Semiconductor devices - Stress migration test standard Part 1: Copper stress migration test standard	Internatio..	2017-08-23	现行
I.S. EN 60749-5:2017	Semiconductor Devices - Mechanical and Climatic Test Methods Part 5: Steady-state Temperature Humidity Bias Life Test (iec 60749-5:2017)	National S..	2017-07-25	现行

全选

首页上一页12 3 4 5 6 ...下一页尾页