I.S. EN 60749-5:2017现行
Semiconductor Devices - Mechanical and Climatic Test Methods Part 5: Steady-state Temperature Humidity Bias Life Test (iec 60749-5:2017)
出版：National Standards Authority of Ireland
专家解读视频
Defines a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.
NF EN 60749-5 : 2003 - Identical
UNE EN 60749-5 : 2003 - Identical
NBN EN 60749-5 : 2004 - Identical
SN EN 60749-5 : 2003 - Identical
BS EN 60749-5 : 2017 - Identical
EN 60749-5 : 2017 - Identical
DIN EN 60749-5 : 2003 - Identical
BS EN 60749-5 : 2017 - Identical
DIN EN 60749-5 : 2003 - Identical
BS EN 60749-5:2017 - Identical
EN 60749-5:2017 - Identical
