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标准编号	标准名称	发布部门	发布日期	状态
I.S. EN 60749-44:2016	Semiconductor Devices - Mechanical and Climatic Test Methods Part 44: Neutron Beam Irradiated Single Event Effect (see) Test Method for Semiconductor Devices	National S..	2016-11-08	现行
IEC 60191-6-13 Ed. 2.0	Mechanical standardization of semiconductor devices Part 6-13: Design guideline of open-top-type sockets for Fine-pitch Ball Grid Array (FBGA) and Fine-pitch Land Grid Array (FLGA)	Internatio..	2016-09-27	现行
IEC 61975 Ed. 1.1	High-voltage direct current (HVDC) installations - System tests	Internatio..	2016-09-12	现行
IEC 61975 Amd.1 Ed. 1.0	Amendment 1 - High-voltage direct current (HVDC) installations - System tests	Internatio..	2016-09-12	现行
DIN EN 62969-2 (2016-09)	Semiconductor Devices - Semiconductor Interface For Automotive Vehicles - Part 2: Efficiency Evaluation Methods Of Wireless Power Transmission Using Resonance For Automotive Vehicles Sensors (iec 47/2273/cd:2016)	Verband De..	2016-09-01	现行
DIN EN 62969-4 (2016-08)	Semiconductor Devices - Semiconductor Interface For Automotive Vehicles - Part 4: Evaluation Method Of Data Interface For Automotive Vehicle Sensors (iec 47/2275/cd:2016)	Verband De..	2016-08-01	现行
DIN EN 62047-29 (2016-08)	Semiconductor devices - Micro-electromechanical devices Part 29: Electromechanical relaxation test method for freestanding conductive thin-films under room temperature (IEC 47F/243/CD:2016)	German Ins..	2016-08-01	现行
IEC 60749-44 Ed. 1.0	Semiconductor devices - Mechanical and climatic test methods Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices	Internatio..	2016-07-21	现行
I.S. EN 62779-3:2016	Semiconductor Devices - Semiconductor Interface for Human Body Communication Part 3: Functional Type and its Operational Conditions	National S..	2016-06-28	现行
I.S. EN 62779-1:2016	Semiconductor Devices - Semiconductor Interface for Human Body Communication Part 1: General Requirements	National S..	2016-06-21	现行
I.S. EN 62779-2:2016	Semiconductor Devices - Semiconductor Interface for Human Body Communication Part 2: Characterization of Interfacing Performances	National S..	2016-06-14	现行
ASTM E431-96(2016)	Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices	American S..	2016-06-01	现行
IEC 62779-3 Ed. 1.0	Semiconductor devices - Semiconductor interface for human body communication Part 3: Functional type and its operational conditions	Internatio..	2016-04-26	现行
IEC 62779-2 Ed. 1.0	Semiconductor devices - Semiconductor interface for human body communication Part 2: Characterization of interfacing performances	Internatio..	2016-02-18	现行
IEC 62779-1 Ed. 1.0	Semiconductor devices - Semiconductor interface for human body communication Part 1: General requirements	Internatio..	2016-02-18	现行
DIN EN 62047-15 (2016-01)	Semiconductor Devices - Micro-electromechanical Devices - Part 15: Test Method Of Bonding Strength Between Pdms And Glass (iec 62047-15:2015)	German Ins..	2016-01-01	现行
DIN EN 62047-16 (2015-12)	Semiconductor Devices - Micro-electromechanical Devices - Part 16: Test Methods For Determining Residual Stresses Of Mems Films - Wafer Curvature And Cantilever Beam Deflection Methods (iec 62047-16:2015)	German Ins..	2015-12-01	现行
DIN EN 62047-17 (2015-12)	Semiconductor Devices - Micro-electromechanical Devices - Part 17: Bulge Test Method For Measuring Mechanical Properties Of Thin Films (iec 62047-17:2015)	German Ins..	2015-12-01	现行
I.S. EN 62007-1:2015	Semiconductor Optoelectronic Devices for Fibre Optic System Applications Part 1: Specification Template for Essential Ratings and Characteristics	National S..	2015-07-14	现行
BS EN 60747-5-5:2011+A1:2015	Semiconductor Devices - Discrete Devices - Part 5-5: Optoelectronic Devices - Photocouplers	British St..	2015-06-30	现行

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