UNE EN 60749-4:2003现行
Semiconductor Devices - Mechanical And Climatic Test Methods - Damp Heat, Steady State, Highly Accelerated Stress Test (hast)
出版：Asociacion Espanola de Normalizacion
专家解读视频
Gives a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.
Supersedes UNE EN 60749. (10/2005)
DIN EN 60749-4 : 2016 - Identical
BS EN 60749-4 : 2017 - Identical
I.S. EN 60749-4:2017 - Identical
DIN EN 60749-4 : 2016 - Identical
EN 60749-4:2017 - Identical
BS EN 60749-4:2017 - Identical
BS EN 60749-4:2002 - Identical
DIN EN 60749-4 (2003-04) - Identical
NBN EN 60749-4:2003 - Identical
NF EN 60749-4:2002 - Identical
I.S. EN 60749-4:2002 - Identical
IEC 60749-4 Ed. 1.0 - Identical
SS EN 60749-4 Ed. 1 (2003) - Identical
