NF EN 60749-29:2004被替代
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 29: Latch-up Test
出版：Association Francaise de Normalisation
专家解读视频
Specifies the I-test and the overvoltage latch-up testing of integrated circuits. It establishes a method for determining integrated circuit latch-up characteristics and to define latch-up failure criteria.
Indice de classement: C96-022-29. (05/2004)
I.S. EN 60749-29:2003 - Identical
NBN EN 60749-29:2005 - Identical
DIN EN 60749-29 (2004-07) - Identical
DIN EN 60749-29 (2012-01) - Identical
NBN EN 60749-29:2011 - Identical
BS EN 60749-29:2011 - Identical
EN 60749-29:2011 - Identical
I.S. EN 60749-29:2011 - Identical
BS EN 60749-29:2003 - Identical
IEC 60749-29 Ed. 1.0 - Identical
SS EN 60749-29 Ed. 1 (2004) - Identical
UNE EN 60749-29:2004 - Identical
