DIN EN 60749-29 (2004-07)被替代
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 29: Latch-up Test
出版：German Institute for Standardisation (Deutsches Institut für Normung)
专家解读视频
Specifies the I-test and the overvoltage latch-up testing of integrated circuits. It establishes a method for determining integrated circuit latch-up characteristics and to define latch-up failure criteria.
DRAFT 2009 issued in November 2009. (12/2009)
EN 60749-29:2011 - Identical
NBN EN 60749-29:2011 - Identical
BS EN 60749-29:2003 - Identical
NBN EN 60749-29:2005 - Identical
NF EN 60749-29:2004 - Identical
I.S. EN 60749-29:2003 - Identical
IEC 60749-29 Ed. 1.0 - Identical
SS EN 60749-29 Ed. 1 (2004) - Identical
UNE EN 60749-29:2004 - Identical
