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IEC 60749-29 Ed. 1.0被替代

Semiconductor devices - Mechanical and climatic test methods Part 29: Latch-up test

出版:International Electrotechnical Committee

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基本信息
标准编号: IEC 60749-29 Ed. 1.0
发布时间:2003/11/4 0:00:00
标准类别:Standard
出版单位:International Electrotechnical Committee
标准页数:41
标准简介

Covers the I-test and the overvoltage latch-up testing of integrated circuits. The purpose of this test is to establish a method for determining integrated circuit latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing ""No Trouble Found"" and ""Electrical Overstress"" failures due to l

本标准替代的旧标准

IEC/PAS 62181 Ed. 1.0

替代本标准的新标准

IEC 60749-29 Ed. 2.0

等同采用的国际标准

DIN EN 60749-29 (2004-07) - Identical

NF EN 60749-29:2004 - Identical

I.S. EN 60749-29:2003 - Identical

PN EN 60749-29:2006 - Identical

SS EN 60749-29 Ed. 1 (2004) - Identical

CEI EN 60749-29 Ed. 1 (2004) - Identical

BS EN 60749-29:2003 - Identical

UNE EN 60749-29:2004 - Identical

NEN EN IEC 60749-29:2004 - Identical