BS EN 60749-29:2011现行
Semiconductor devices. Mechanical and climatic test methods. Latch-up test
出版：British Standards Institution
专家解读视频
Specifies the I-test and the overvoltage latch-up testing of integrated circuits. It establishes a method for determining integrated circuit latch-up characteristics and to define latch-up failure criteria.
© British Standards Institution 2013
UNE EN 60749-29:2004 - Identical
SS EN 60749-29 Ed. 2 (2011) - Identical
DIN EN 60749-29 : 2012 - Identical
I.S. EN 60749-29:2011 - Identical
IEC 60749-29 : 2.0 - Identical
I.S. EN 60749-29:2011 - Identical
EN 60749-29 : 2011 - Identical
NBN EN 60749-29 : 2011 - Identical
DIN EN 60749-29 : 2012 - Identical
NF EN 60749-29:2004 - Identical
NF EN 60749-29:2012 - Identical
DIN EN 60749-29 (2012-01) - Identical
NBN EN 60749-29:2011 - Identical
EN 60749-29:2011 - Identical
I.S. EN 60749-29:2011 - Identical
IEC 60749-29 Ed. 2.0 - Identical
SS EN 60749-29 Ed. 1 (2004) - Identical
NF EN 60749-29 : 2012 - Identical
UNE EN 60749-29 : 2004 - Identical
