I.S. EN 60749-29:2011现行
Semiconductor Devices - Mechanical and Climatic Test Methods Part 29: Latch-up Test
出版：National Standards Authority of Ireland
专家解读视频
Specifies the I-test and the overvoltage latch-up testing of integrated circuits. It establishes a method for determining integrated circuit latch-up characteristics and to define latch-up failure criteria.
UNE EN 60749-29:2004 - Identical
NF EN 60749-29:2004 - Identical
EN 60749-29:2011 - Identical
BS EN 60749-29:2011 - Identical
NBN EN 60749-29:2011 - Identical
SS EN 60749-29 Ed. 2 (2011) - Identical
NF EN 60749-29:2012 - Identical
UNE EN 60749-29 : 2004 - Identical
NF EN 60749-29 : 2012 - Identical
DIN EN 60749-29 : 2012 - Identical
NBN EN 60749-29 : 2011 - Identical
EN 60749-29 : 2011 - Identical
IEC 60749-29 : 2.0 - Identical
BS EN 60749-29 : 2011 - Identical
BS EN 60749-29 : 2011 - Identical
DIN EN 60749-29 : 2012 - Identical
