
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 32: Flammability Of Plastic-encapsulated Devices (externally Induced)
出版:German Institute for Standardisation (Deutsches Institut für Normung)

专家解读视频
Applies to semiconductor devices (discrete devices and integrated circuits). It determines whether the device ignites due to external heating.
Supersedes DIN EN 60749 (06/2005) DRAFT AMD 1 issued in September 2009. (10/2009)
EN 60749-32:2003 - Identical
NBN EN 60749-32:2004 - Identical
BS EN 60749-32:2003 - Identical
SN EN 60749-32:2003 - Identical
NF EN 60749-32:2003 - Identical
I.S. EN 60749-32:2003 - Identical
IEC 60749-32 Ed. 1.0 - Identical
SS EN 60749-32 Ed. 1 (2003) - Identical
UNE EN 60749-32:2004 - Identical