
Semiconductor devices. Mechanical and climatic test methods. Flammability of plastic-encapsulated devices (externally induced)
出版:British Standards Institution

专家解读视频
Applies to semiconductor devices (discrete devices and integrated circuits). It determines whether the device ignites due to external heating.
© British Standards Institution 2013
UNE EN 60749-32:2004 - Identical
I.S. EN 60749-32:2003 - Identical
EN 60749-32:2003 - Identical
SS EN 60749-32 Ed. 1 (2003) - Identical
IEC 60749-32 Ed. 1.0 - Identical
SN EN 60749-32:2003 - Identical
DIN EN 60749-32 (2003-12) - Identical
NBN EN 60749-32:2004 - Identical
NF EN 60749-32:2003 - Identical
SS EN 60749-32:2003 - Identical
DIN EN 60749-32 : 2011 - Identical
IEC 60749-32 : 1.1 - Identical
I.S. EN 60749-32:2003 - Identical
UNE EN 60749-32 : 2004 - Identical
EN 60749-32 : 2003 AMD 1 2010 - Identical
NF EN 60749-32 : 2003 AMD 1 2011 - Identical
NBN EN 60749-32 : 2004 AMD 1 2010 - Identical
SN EN 60749-32 : 2003 - Identical
DIN EN 60749-32 : 2011 - Identical
I.S. EN 60749-32:2003 - Identical
SN EN 60749-32 : 2003 - Identical