IEC 60749-32 Ed. 1.1现行
Semiconductor devices - Mechanical and climatic test methods Part 32: Flammability of plastic-encapsulated devices (externally induced)
出版：International Electrotechnical Committee
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基本信息
标准编号： IEC 60749-32 Ed. 1.1
发布时间：2010/11/29 0:00:00
标准类别：Standard
出版单位：International Electrotechnical Committee
标准页数：9
标准简介
IEC 60749-32:2002+A1:2010 is applicable to semiconductor devices (discrete devices and integrated circuits). The object of this test is to determine whether the device ignites due to external heating. The test uses a needle flame, simulating the effect of small flames which may result from fault conditions within equipment containing the device. This consolidated version consists of the first edition (2002) and its amendment 1 (2010). Therefore, no need to order amendment in addition to this publication.
本标准替代的旧标准
