NEN EN IEC 60749-27:2007现行
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 27: Electrostatic Discharge (esd) Sensitivity Testing - Machine Model (mm)
出版：Nederlands Normalisatie Instituut
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基本信息
标准编号： NEN EN IEC 60749-27:2007
发布时间：2007/11/1 0:00:00
标准类别：Standard
出版单位：Nederlands Normalisatie Instituut
标准页数：25
标准简介
Defines a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model (MM) electrostatic discharge (ESD).
